Broadband measurement of the conductivity and the permittivity of semiconducting materials in high voltage XLPE cables

Publication
Eighth International Conference on Dielectric Materials, Measurements and Applications
Record type
Proceedings article
Published
2000
Authors
R. Heinrich
DOI
https://doi.org/10.1049/cp:20000507
The publisher of this work supports multiple resolution. The work is available from the following locations:
theiet.org
ieee.org

debug {'doi': '10.1049/cp:20000507', 'member_id': '265', 'member': 'IEE', 'container-title': 'Eighth International Conference on Dielectric Materials, Measurements and Applications', 'primary-resource': 'https://digital-library.theiet.org/content/conferences/10.1049/cp_20000507', 'tld': 'theiet.org', 'clearbit-logo': 'https://logo.clearbit.com/theiet.org', 'coaccess': [], 'multiple-resolution': [{'url': 'http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=888116', 'tld': 'ieee.org', 'clearbit-logo': 'https://logo.clearbit.com/ieee.org'}], 'type': 'PROCEEDINGS ARTICLE', 'published_date': '2000', 'publication': 'Eighth International Conference on Dielectric Materials, Measurements and Applications', 'title': 'Broadband measurement of the conductivity and the permittivity of semiconducting materials in high voltage XLPE cables', 'name': None, 'id': None, 'location': None, 'display_doi': 'https://doi.org/10.1049/cp:20000507', 'grant_info': None, 'grant_info_funders': None, 'grant_info_funder_ids': '', 'grant_info_type': None, 'multiple_lead_investigators': [], 'multiple_co_lead_investigators': [], 'multiple_investigators': [], 'finances': [], 'project_description': None, 'award_amount': None, 'award_start': None, 'funding_scheme': None, 'internal_award_number': None, 'editors': None, 'authors': 'R. Heinrich', 'chairs': None, 'supplementary_ids': None}
https://doi.org/10.1049/cp:20000507
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