debug
{'doi': '10.1049/el:19940843', 'member_id': '265', 'member': 'Institution of Engineering and Technology (IET)', 'container-title': 'Electronics Letters', 'primary-resource': 'http://digital-library.theiet.org/doi/10.1049/el%3A19940843', 'tld': 'theiet.org', 'clearbit-logo': '/static/no_logo.svg', 'coaccess': [], 'multiple-resolution': [], 'type': 'JOURNAL ARTICLE', 'published_date': '21 July 1994', 'publication': 'Electronics Letters', 'title': 'Novel ELFIN (\n <u>e</u>\n mbedded-metal-\n <u>l</u>\n ayer process for\n <u>f</u>\n ully\n <u>i</u>\n ntegrated\n <u>N</u>\n OR) cell for 16/64 Mbit flash EEPROM', 'name': None, 'id': None, 'location': None, 'display_doi': 'https://doi.org/10.1049/el:19940843', 'grant_info': None, 'grant_info_funders': None, 'grant_info_funder_ids': '', 'grant_info_type': None, 'multiple_lead_investigators': [], 'multiple_co_lead_investigators': [], 'multiple_investigators': [], 'finances': [], 'project_description': None, 'award_amount': None, 'award_start': None, 'funding_scheme': None, 'internal_award_number': None, 'editors': None, 'authors': 'Y. Kawazu | T. Hayashi | M. Ohno | T. Ono | A. Uchiyama', 'chairs': None, 'supplementary_ids': '10.1049/el:19940843'}
https://doi.org/10.1049/el:19940843
JSON
XML