An AC-based capacitance measuring circuit for tomography systems and its silicon chip design

Publication
IEE Colloquium on Advances in Sensors
Record type
Proceedings article
Published
1995
Authors
H. Hahnel
DOI
https://doi.org/10.1049/ic:19951510
The publisher of this work supports multiple resolution. The work is available from the following locations:
theiet.org
ieee.org

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https://doi.org/10.1049/ic:19951510
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