A DFT technique to increase the resolution of AC RMS power supply current monitoring of complex analogue circuits

Publication
IEE Colloquium on Testing Mixed Signal Circuits and Systems
Record type
Proceedings article
Published
1997
Authors
C.D. Chalk
DOI
https://doi.org/10.1049/ic:19971200
The publisher of this work supports multiple resolution. The work is available from the following locations:
theiet.org
ieee.org

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https://doi.org/10.1049/ic:19971200
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